DocumentCode
1766995
Title
Improved phase linearity in source field plate AlGaN/GaN HEMTs
Author
Colantonio, P. ; Giannini, F. ; Giofre, R. ; Piazzon, L. ; Camarchia, V. ; Ghione, G. ; Pirola, M. ; Quaglia, R. ; Nanni, A. ; Pantellini, A. ; Lanzieri, C.
Author_Institution
DEE, Univ. of Roma Tor Vergata, Rome, Italy
fYear
2014
fDate
6-9 Oct. 2014
Firstpage
1293
Lastpage
1296
Abstract
The benefits of using source field plate (FPS) in AlGaN/GaN HEMTs to reduce the phase distortion in efficient power amplifiers (PAs) is demonstrated in this contribution. The link between phase distortion of a PA and the drain - to - gate feedback parasitic capacitance of the transistor is shown. This link leads to critical phase nonlinearity expecially when architectures based on output load modulation, as the Doherty topology, are adopted. The FPS effect in reducing the feedback parasitic capacitance and, thus, the AM/PM distortion of the PA is verified. For experimental validation two AlGaN/GaN HEMT structures, with and without FPS, are realized and compared in order to extract the effects of FPS. Source-load pull characterizations are performed on both structures in order to verify the benefits of FPS on phase distortion, both in fixed and modulated output load conditions.
Keywords
HEMT circuits; III-V semiconductors; aluminium compounds; gallium compounds; linearisation techniques; power amplifiers; wide band gap semiconductors; AlGaN-GaN; Doherty topology; drain - gate feedback parasitic capacitance; phase distortion reduction; phase linearity; power amplifier; source field plate HEMT; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Phase distortion;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2014 44th European
Conference_Location
Rome
Type
conf
DOI
10.1109/EuMC.2014.6986680
Filename
6986680
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