DocumentCode :
1767868
Title :
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage
Author :
Ayadi, Mounir ; Briat, Olivier ; Lallemand, Richard ; Coquery, G. ; Vinassa, Jean-Michel
Author_Institution :
IMS, Univ. Bordeaux, Talence, France
fYear :
2014
fDate :
1-4 June 2014
Firstpage :
1823
Lastpage :
1828
Abstract :
In this paper, we focus on impacts of thermal cycling ageing on supercapacitors performances at a constant voltage. We compare obtained results with those coming from simple calendar ageing at constant temperature and voltage. The comparison is based on physics modeling parameters evolution based on results from experimental measurements during calendar ageing up to 10000 h and 6000 h, 8000 h for thermal cycling tests. Finally, the impacts of thermal cycling interval is highlighted and quantified.
Keywords :
ageing; life testing; reliability; supercapacitors; ageing test; calendar ageing; constant voltage; physics modeling parameter; supercapacitor performance fading; thermal cycling ageing; thermal cycling test; time 10000 h; time 6000 h; time 8000 h; Aging; Calendars; Capacitance; Electrodes; Impedance; Supercapacitors; Temperature measurement; Supercapacitors; calendar ageing; thermal cycling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics (ISIE), 2014 IEEE 23rd International Symposium on
Conference_Location :
Istanbul
Type :
conf
DOI :
10.1109/ISIE.2014.6864892
Filename :
6864892
Link To Document :
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