Title :
Mode-Locked 1.33 µm Semiconductor Disk Laser with a Bismuth-Doped Fiber Amplifier
Author :
Rantamaki, Antti ; Heikkinen, Juuso ; Gumenyuk, Regina ; LyytikaInen, J. ; Saarinen, Esa J. ; Leinonen, Tomi ; Melkumov, Mikhail ; Dianov, Evgeny M. ; Okhotnikov, Oleg G.
Author_Institution :
Optoelectron. Res. Centre, Tampere Univ. of Technol., Tampere, Finland
Abstract :
This paper demonstrates a picosecond mode-locked SDL emitting at 1.33 μm with a bismuth-doped fiber amplifier. The 1.33 μm SDL gain chip consisted of an InP-based active region and a GaAs-based distributed Bragg reflector (DBR). Both structures are grown by solid source molecular beam epitaxy (MBE). The active region comprised 10 compressively strained (1%) AlGaInAs quantum wells (QWs). The QWs are placed in a 3-3-2-2 sequence on the antinodes of the optical field. They are sandwiched by AlGaInAs strain compensation layers and the QW groups are separated by lattice matched AlGaInAs spacers. The DBR comprised 25.5 pairs of quarter wave thick GaAs and AlAs layers. The active region and the DBR are bonded together at 200 °C using a monolayer of (3-Mercaptopropyl)trimethoxysilane (MPTMS). The InP substrate is then removed by wet etching and a 2 × 2 mm2 chip is capillary bonded onto a 2° wedged 300 μm thick chemical vapor deposition (CVD) diamond. The top surface of the diamond is antireflection coated with TiO2/SiO2 layers at the signal wavelength. The SESAM used for the mode-locking is similar to the gain element and is irradiated with heavy ions to shorten the recovery time of the absorption.
Keywords :
aluminium compounds; antireflection coatings; bismuth; distributed Bragg reflector lasers; etching; gallium arsenide; high-speed optical techniques; indium compounds; laser mirrors; laser mode locking; molecular beam epitaxial growth; monolayers; optical fibre amplifiers; optical saturable absorption; quantum well lasers; silicon compounds; titanium compounds; (3-mercaptopropyl)trimethoxysilane; AlAs-GaAs-AlGaInAs; DBR; GaAs-based distributed Bragg reflector; InP; InP substrate; InP-based active region; MBE; SESAM; absorption recovery time; antireflection coating; bismuth-doped fiber amplifier; capillary bonding; chemical vapor deposition diamond; compressively strained quantum wells; heavy ion irradiation; lattice matched spacers; monolayer; optical field antinodes; picosecond mode-locked semiconductor disk laser; quarter wave thick layers; semiconductor disk laser gain chip; semiconductor saturable absorber mirrors; signal wavelength; size 300 mum; solid source molecular beam epitaxy; strain compensation layers; temperature 200 degC; wavelength 1.33 mum; wet etching; Fiber lasers; Laser mode locking; Optical fiber amplifiers; Power amplifiers; Power generation; Surface emitting lasers;
Conference_Titel :
Semiconductor Laser Conference (ISLC), 2014 International
Conference_Location :
Palma de Mallorca
Print_ISBN :
978-1-4799-5721-7
DOI :
10.1109/ISLC.2014.194