DocumentCode
1767996
Title
Time-Resolved Photoluminescence Study of InGaAs Quantum Dot Structure Prepared by Ultrahigh-rate Molecular Beam Epitaxial Growth Technique
Author
Sugawara, H. ; Tanoue, F. ; Kitamura, S. ; Katsuyama, Tomokazu ; Akahane, Kouichi ; Yamamoto, Naoji
Author_Institution
Grad. Sch. of Syst. Design, Tokyo Metropolitan Univ., Tokyo, Japan
fYear
2014
fDate
7-10 Sept. 2014
Firstpage
147
Lastpage
148
Abstract
Time-resolved photoluminescence spectroscopy of InGaAs strained quantum dot prepared by ultrahigh-rate MBE growth indicated a small distribution of ground states energies and carrier lifetime as long as 0.9 ns at 77 K.
Keywords
III-V semiconductors; carrier lifetime; gallium arsenide; ground states; indium compounds; molecular beam epitaxial growth; photoluminescence; semiconductor quantum dots; time resolved spectra; InGaAs; InGaAs strained quantum dot; carrier lifetime; ground states energy distribution; molecular beam epitaxial growth technique; temperature 77 K; time 0.9 ns; time-resolved photoluminescence; ultrahigh rate MBE growth; Indium gallium arsenide; Molecular beam epitaxial growth; Photoluminescence; Photonics; Quantum dot lasers; Quantum dots; carrier lifetime; quantum dots; time-resolved photoluminescence;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference (ISLC), 2014 International
Conference_Location
Palma de Mallorca
Print_ISBN
978-1-4799-5721-7
Type
conf
DOI
10.1109/ISLC.2014.206
Filename
6987493
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