Title :
A 10kfps 32×32 integrated test platform for electrical characterization of imagers
Author :
Margarit, J.M. ; Teres, L. ; Cabruja, Enric ; Serra-Graells, F.
Author_Institution :
Inst. de Microelectron. de Barcelona, CNM, Barcelona, Spain
Abstract :
This paper presents an integrated test platform for imagers, which allows their electrical characterization by directly injecting the input current in each individual pixel. The core of the proposed ITP is a matrix of controllable current sources featuring low technology dependence, together with easily scalable row and column DACs for the digital programming of every single pixel current. A 10 kfps 32×32 4 bit×4 bit ITP chip is integrated in a low-cost 2.5 μm 1M CMOS technology, reporting μA-range full-scale and background programmability and FPN levels below 5%rms. As a result, the proposed ITP achieves accurate stimulation of both image patterns and motion sequences with a compact test setup.
Keywords :
CMOS image sensors; constant current sources; digital-analogue conversion; integrated circuit testing; 1M CMOS technology; DAC; FPN level; ITP chip; controllable current source; digital programming; electrical characterization; image motion sequence; imager; integrated test platform; single pixel current; size 2.5 mum; Analytical models; Biomedical optical imaging; CMOS integrated circuits; CMOS technology; Computer architecture; High-speed optical techniques; Programming;
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
DOI :
10.1109/ISCAS.2014.6865063
