Title :
Device engineering and CMOS integration of nanoscale memristors
Author :
Shuang Pi ; Peng Lin ; Hao Jiang ; Can Li ; Qiangfei Xia
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
Abstract :
Our group focuses on developing better nanoscale memristor with improved performance, understanding the underlying device physics, and exploring new applications for this novel device. This paper introduces our recent work on memristor device engineering and CMOS integration. We have fabricated the smallest memristors (8 nm × 8 nm) in a crossbar array, with each of the device consumes orders of magnitude lower energy per switch event than their larger counterparts. We have demonstrated that a very thin layer of chemically produced silicon oxide can be used to make memristors that only need ~0.5 V to switch. We have also proved that with multiple oxides as switching layer, both high ON/OFF ratio and high endurance can be achieved in the same device. Finally, we successfully integrated planar memristors with CMOS substrates, implementing hybrid memristor-CMOS integrated circuit with lower switching voltages and more uniform performance.
Keywords :
CMOS integrated circuits; memristors; nanoelectronics; CMOS integration; CMOS substrates; chemically produced silicon oxide; crossbar array; device physics; hybrid memristor-CMOS integrated circuit; memristor device engineering; nanoscale memristors; planar memristors; size 8 nm; switching layer; switching voltages; CMOS integrated circuits; Electrodes; Memristors; Nanoscale devices; Performance evaluation; Substrates; Switches; SiOx memristor; heterogeneous integration; hybrid circuits; multilayer memristors; nanoimprint lithography; nanoscale memristor;
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
DOI :
10.1109/ISCAS.2014.6865156