DocumentCode :
1768387
Title :
Statistical mechanical Bayesian inference and its application
Author :
Saika, Yohei
Author_Institution :
Dept. of Inf. & Comput. Eng., Nat. Inst. of Technol., Maebashi, Japan
fYear :
2014
fDate :
22-25 Oct. 2014
Firstpage :
1362
Lastpage :
1367
Abstract :
Based on the statistical mechanical Bayesian inference, we construct a method of phase unwrapping using multiple interferograms by making use of the maximizer of the posterior marginal (MPM) estimate due to the Monte Carlo simulation. In this method, we carry out phase unwrapping so as to maximize the marginal posterior probability. We clarify from the phase diagram in hyper-parameter space that the MPM estimate realizes phase unwrapping perfectly without using prior information under the constraint of the surface-consistency condition, if observed interferograms are not corrupted, and that prior information is useful for extending domain where phase unwrapping is realized with high degree of accuracy, if the interferograms are corrupted. Also, we find that results obtained by the extended mean-field theory are qualitatively confirmed by the MPM estimate due to the Monte Carlo simulation.
Keywords :
Bayes methods; Monte Carlo methods; image restoration; interferometry; statistical analysis; MPM estimate; Monte Carlo simulation; extended mean-field theory; hyper-parameter space; image restoration; marginal posterior probability maximization; maximizer-of-the-posterior marginal estimate; multiple interferograms; phase diagram; phase unwrapping method; prior information; qualitative analysis; statistical mechanical Bayesian inference; surface-consistency condition; Bayesian inference; multiple interferograms; phase unwrapping; statistical mechanics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control, Automation and Systems (ICCAS), 2014 14th International Conference on
Conference_Location :
Seoul
ISSN :
2093-7121
Print_ISBN :
978-8-9932-1506-9
Type :
conf
DOI :
10.1109/ICCAS.2014.6987768
Filename :
6987768
Link To Document :
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