Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

Author

Khan, N.A. ; Schires, K. ; Hurtado, A. ; Henning, I.D. ; Adams, M.J.

Author_Institution

Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK

Volume

49

Issue

11

fYear

2013

fDate

Nov. 2013

Firstpage

990

Lastpage

996

Abstract

In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.

Keywords

electromagnetic oscillations; light polarisation; semiconductor lasers; surface emitting lasers; VCSEL; measurement; polarization resolved linewidth enhancement factor; temperature -20 degC to 60 degC; temperature-dependent relaxation oscillation frequency; thermal effects; wavelength 1550 nm; Current measurement; Frequency measurement; Optical polarization; Temperature distribution; Temperature measurement; Vertical cavity surface emitting lasers; Linewidth enhancement factor; relaxation oscillation frequency (ROF); semiconductor lasers; vertical-cavity surface-emitting lasers (VCSELs);

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2013.2282759

Filename

6605534