Title :
Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit
Author :
Heittmann, A. ; Noll, Tobias G.
Author_Institution :
Electr. Eng. & Comput. Syst., RWTH Aachen Univ., Aachen, Germany
Abstract :
In this paper, a novel adaptable reference circuit is proposed which can be used to calibrate the switching threshold of a read amplifier. The circuit is based on a network of nanoelectronic resistive switches acting as voltage dividers. In addition, active CMOS circuits are included which are used to tune the output voltage of the circuit. For the performance analysis variability models were applied for both, the CMOS part as well as the resistive switch part. The analysis shows that the output voltage can achieve a resolution for the reference voltage considerably better than 5mV. Finally, the tradeoff between resolution and required programming time is elaborated.
Keywords :
CMOS memory circuits; active networks; hybrid integrated circuits; integrated circuit metallisation; nanoelectronics; reference circuits; switches; voltage dividers; active CMOS circuits; hybrid CMOS/RS nanoelectronic calibration circuit; nanoelectronic resistive switches; performance analysis variability models; read amplifier; reference circuit; switching threshold; variability analysis; voltage dividers; CMOS integrated circuits; Calibration; Electrodes; Electronic countermeasures; Programming; Switches; Transistors; calibration; electrochemical metallization cell; nanoelectronics; passive crossbar; resistive switches; variability;
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
DOI :
10.1109/ISCAS.2014.6865470
