Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit

Author

Heittmann, A. ; Noll, Tobias G.

Author_Institution

Electr. Eng. & Comput. Syst., RWTH Aachen Univ., Aachen, Germany

fYear

2014

fDate

1-5 June 2014

Firstpage

1656

Lastpage

1659

Abstract

In this paper, a novel adaptable reference circuit is proposed which can be used to calibrate the switching threshold of a read amplifier. The circuit is based on a network of nanoelectronic resistive switches acting as voltage dividers. In addition, active CMOS circuits are included which are used to tune the output voltage of the circuit. For the performance analysis variability models were applied for both, the CMOS part as well as the resistive switch part. The analysis shows that the output voltage can achieve a resolution for the reference voltage considerably better than 5mV. Finally, the tradeoff between resolution and required programming time is elaborated.

Keywords

CMOS memory circuits; active networks; hybrid integrated circuits; integrated circuit metallisation; nanoelectronics; reference circuits; switches; voltage dividers; active CMOS circuits; hybrid CMOS/RS nanoelectronic calibration circuit; nanoelectronic resistive switches; performance analysis variability models; read amplifier; reference circuit; switching threshold; variability analysis; voltage dividers; CMOS integrated circuits; Calibration; Electrodes; Electronic countermeasures; Programming; Switches; Transistors; calibration; electrochemical metallization cell; nanoelectronics; passive crossbar; resistive switches; variability;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2014 IEEE International Symposium on

Conference_Location

Melbourne VIC

Print_ISBN

978-1-4799-3431-7

Type

conf

DOI

10.1109/ISCAS.2014.6865470

Filename

6865470