Title :
Interactive nonlinear optimization-based method for correcting the pin probe position in printed circuit board electrical inspections
Author :
Katagiri, Hideki ; Morisawa, Masayuki ; Hongwei Wu ; Hamori, Hiroshi ; Kato, Kazuhiko
Author_Institution :
Grad. Sch. of Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
Abstract :
Pin probe inspection methods have been widely used in printed circuit board electrical inspection. Due to the miniaturization of electronic devices, the positioning of inspection jig (called probe jig) is very important for precisely conducting pattern tests of wiring on PCBs. This article newly develops a probe jig position correction algorithm that automatically calculates optimal correction amounts of a probe jig through interactive processes between an operator and the system. In the proposed method, optimal correction amounts of a probe jig are calculated by nonlinear programming techniques. The proposed algorithm is installed into real PCB inspection machines. It is shown that the proposed method significantly reduces the setup time for PCB inspections.
Keywords :
inspection; nonlinear programming; printed circuit testing; PCB wiring; conducting pattern tests; inspection jig; interactive nonlinear optimization method; optimal correction; pin probe position; printed circuit board electrical inspections; probe jig; Inspection; Manuals; Printed circuits; Programming; Printed circuit board (PCB); electrical inspection; interactive algorithm; nonlinear optimization; wiring pattern test;
Conference_Titel :
Computational Intelligence and Applications (IWCIA), 2014 IEEE 7th International Workshop on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4799-4771-3
DOI :
10.1109/IWCIA.2014.6988082