• DocumentCode
    1768989
  • Title

    Interactive nonlinear optimization-based method for correcting the pin probe position in printed circuit board electrical inspections

  • Author

    Katagiri, Hideki ; Morisawa, Masayuki ; Hongwei Wu ; Hamori, Hiroshi ; Kato, Kazuhiko

  • Author_Institution
    Grad. Sch. of Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
  • fYear
    2014
  • fDate
    7-8 Nov. 2014
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    Pin probe inspection methods have been widely used in printed circuit board electrical inspection. Due to the miniaturization of electronic devices, the positioning of inspection jig (called probe jig) is very important for precisely conducting pattern tests of wiring on PCBs. This article newly develops a probe jig position correction algorithm that automatically calculates optimal correction amounts of a probe jig through interactive processes between an operator and the system. In the proposed method, optimal correction amounts of a probe jig are calculated by nonlinear programming techniques. The proposed algorithm is installed into real PCB inspection machines. It is shown that the proposed method significantly reduces the setup time for PCB inspections.
  • Keywords
    inspection; nonlinear programming; printed circuit testing; PCB wiring; conducting pattern tests; inspection jig; interactive nonlinear optimization method; optimal correction; pin probe position; printed circuit board electrical inspections; probe jig; Inspection; Manuals; Printed circuits; Programming; Printed circuit board (PCB); electrical inspection; interactive algorithm; nonlinear optimization; wiring pattern test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Applications (IWCIA), 2014 IEEE 7th International Workshop on
  • Conference_Location
    Hiroshima
  • ISSN
    1883-3977
  • Print_ISBN
    978-1-4799-4771-3
  • Type

    conf

  • DOI
    10.1109/IWCIA.2014.6988082
  • Filename
    6988082