Title :
Extensional design for noise-tolerate MRF standard cells via global mapping
Author :
Yan Li ; Jianhao Hu
Author_Institution :
Nat. key Lab. of Commun., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
As CMOS devices scaling down according to the Moore´ law, the reliability and stability of circuit become the main challenge for the chip designs in low supply voltage. Markov Random field (MRF) based design methodology presents a new approach to establish high noise-immune structure for low-power circuit design from the viewpoint of energy. We use global mapping to synthesize all two-input functions and realize the MRF based circuits, then the final structures our provided with same complexity, which does not depend on the inside logic operations any more, but the number of the input-signal instead, which inspires us to extend the MRF standard cells. Our proposed structures keep the performance of fault-tolerance and achieve higher efficiency for energy, time and area compared with that of traditional MRF-circuits. The extensional basic units also can beneficial for saving area in multi-level MRF-circuit.
Keywords :
CMOS digital integrated circuits; CMOS logic circuits; Markov processes; fault tolerance; integrated circuit design; integrated circuit reliability; logic design; low-power electronics; CMOS devices; MRF standard cells; Markov random field; Moore law; chip designs; fault tolerance; global mapping; integrated circuit design; integrated circuit reliability; low-power circuit design; multilevel MRF circuit; noise-immune structure; CMOS integrated circuits; Circuit synthesis; Complexity theory; Logic functions; Markov random fields; Noise; Standards;
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
DOI :
10.1109/ISCAS.2014.6865488
