Performance degradation simulation of electronic product for reliability analysis

To study analysis method of performance degradation during long term operation based on function simulation, accelerated degradation test was carried out on the power supply module directly, and the test data was used for reliability analysis. As the same time, accelerated degradation test was carried out on the key components in power supply circuit. The test data was injected into the functional simulation model of power supply to simulate performance degradation and analyze reliability. Finally the results of the two kinds of analysis were compared to demonstrate the effectiveness of the proposed simulation method. Comparison shows that average life span of power supply is 281560 hours based on accelerated degradation test while 357290 hours based on degradation simulation. Since only considering degradation of the key components, the result of simulation method is of partial optimism. But the deviation is in a reasonable range, which proved that the method is effective.