• DocumentCode
    1769313
  • Title

    Capacitor mismatch calibration for SAR ADCs based on comparator metastability detection

  • Author

    Long Chen ; Ji Ma ; Nan Sun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    2357
  • Lastpage
    2360
  • Abstract
    A novel digital calibration technique is proposed to calibrate the capacitor mismatch in SAR ADCs. The capacitor mismatches are extracted based on the comparator metastability and intrinsic noise. The proposed technique does not require additional external control sequences or any modification of the main DAC. The simulation results of a 12-bit SAR ADC with 10% capacitor mismatch show that the SNDR and SFDR are improved by 13.9dB and 34.9dB respectively with the proposed calibration technique. The calibration technique is effective under process variation based on a Monte-Carlo simulation.
  • Keywords
    Monte Carlo methods; analogue-digital conversion; calibration; capacitors; circuit noise; comparators (circuits); Monte Carlo simulation; SAR ADC; capacitor mismatch calibration; comparator metastability detection; digital calibration; successive approximation register analog-to-digital converter; word length 12 bit; Calibration; Capacitors; Logic gates; Mathematical model; Noise; Quantization (signal); Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
  • Conference_Location
    Melbourne VIC
  • Print_ISBN
    978-1-4799-3431-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2014.6865645
  • Filename
    6865645