DocumentCode :
1769313
Title :
Capacitor mismatch calibration for SAR ADCs based on comparator metastability detection
Author :
Long Chen ; Ji Ma ; Nan Sun
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
2357
Lastpage :
2360
Abstract :
A novel digital calibration technique is proposed to calibrate the capacitor mismatch in SAR ADCs. The capacitor mismatches are extracted based on the comparator metastability and intrinsic noise. The proposed technique does not require additional external control sequences or any modification of the main DAC. The simulation results of a 12-bit SAR ADC with 10% capacitor mismatch show that the SNDR and SFDR are improved by 13.9dB and 34.9dB respectively with the proposed calibration technique. The calibration technique is effective under process variation based on a Monte-Carlo simulation.
Keywords :
Monte Carlo methods; analogue-digital conversion; calibration; capacitors; circuit noise; comparators (circuits); Monte Carlo simulation; SAR ADC; capacitor mismatch calibration; comparator metastability detection; digital calibration; successive approximation register analog-to-digital converter; word length 12 bit; Calibration; Capacitors; Logic gates; Mathematical model; Noise; Quantization (signal); Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
Type :
conf
DOI :
10.1109/ISCAS.2014.6865645
Filename :
6865645
Link To Document :
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