DocumentCode :
1769322
Title :
A statistic based time skew calibration method for time-interleaved ADCs
Author :
Qiu Lei ; Yuanjin Zheng ; Di Zhu ; Siek, Liter
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
2373
Lastpage :
2376
Abstract :
In this paper, a statistic based time skew calibration method for time-interleaved ADCs is presented. By comparing the mean value of the multiplication of signals in two adjacent channels, the time skew can be estimated. Subsequently, a capacitor array based digitally controlled delay block placed in sampling clock path is adopted to compensate the time skew. In addition, the precision of calibration is further improved through using a monotonic small capacitor array. In a 4-channel 1GS/s 12-bit TI-ADC system, the spurious free dynamic range (SFDR) can be improved to 77.5dB with 0.25ps LSB in the digitally controlled delay block.
Keywords :
analogue-digital conversion; calibration; delay circuits; statistics; adjacent channel; analog-digital converter; digitally controlled delay block; mean value; monotonic small capacitor array; sampling clock; signal multiplication; statistic based time skew calibration method; time interleaved ADC; time skew estimation; Analog-digital conversion; Arrays; Bandwidth; Calibration; Capacitors; Clocks; Delays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
Type :
conf
DOI :
10.1109/ISCAS.2014.6865649
Filename :
6865649
Link To Document :
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