Title :
Memristive devices for stochastic computing
Author :
Gaba, Siddharth ; Knag, Phil ; Zhang, Zhenhao ; Wei Lu
Author_Institution :
Electr. Eng. & Comput. Sci., Univ. of Michigan - Ann Arbor, Ann Arbor, MI, USA
Abstract :
We show resistive switching effects in memristive devices exhibit significant stochasticity. When the switching is dominated by a single filament, the switching time is fully random and shows a broad distribution. However, the switching distribution can be predicted and responds well to controlled changes in the programming conditions. The native stochastic characteristic can be used to generate random bit streams with predictable biases that can lead to efficient and error-tolerant computing.
Keywords :
memristors; stochastic processes; switching circuits; error tolerant computing; memristive devices; resistive switching effect; stochastic computing; switching distribution; Arrays; Current measurement; Memristors; Programming; Stochastic processes; Switches; Voltage measurement; bit stream; filament; memristor; stochastic;
Conference_Titel :
Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
Conference_Location :
Melbourne VIC
Print_ISBN :
978-1-4799-3431-7
DOI :
10.1109/ISCAS.2014.6865703