• DocumentCode
    1769726
  • Title

    How much time does FET scaling have left?

  • Author

    Mamaluy, D. ; Gao, X. ; Tierney, Brian

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2014
  • fDate
    3-6 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The ultimate end of CMOS scaling was predicted almost immediately after the now ubiquitous technology was invented by Frank Wanlass in 1963 [1]. Indeed, many possible limitations to downscaling were discussed in the 1970s, 80s, and 90s [2]. In 2003, Zhirnov et al. [3] estimated the minimal feature size of a “binary logic switch” to be around 1.5nm, based on the Heisenberg uncertainty and Landauer principles. Since then, there have been many papers [2,4,5] discussing the likely end of CMOS scaling due to lithographical, power-thermal, material, and other technological, as opposed to fundamental physical, limitations. In this work, we compute the device switching energy, CgVg2, for several representative FinFET/MuGFET devices, and explore the role of this quantity as a fundamental physical scaling limitation, which we predict will occur around 2030. In doing so, ITRS downscaling projection data [6] is utilized for reference. MuGFET switching energies are plotted as the blue curve in Fig. 1, in units of 100kBT (T=300K), as FET gate lengths are scaled to 6-nm and below. The inset of Fig. 1 represents our extrapolation of ITRS data. This new way of plotting switching energy reveals that as gate lengths arescaled below about 5nm, the switching energy approaches that of thermal fluctuations.
  • Keywords
    CMOS integrated circuits; MOSFET circuits; CMOS scaling; FET gate lengths; FET scaling; FinFET-MuGFET devices; Heisenberg uncertainty; ITRS downscaling projection data; Landauer principles; binary logic switch; device switching energy; size 6 nm; thermal fluctuations; ubiquitous technology; FinFETs; Fluctuations; Laboratories; Logic gates; Silicon; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics (IWCE), 2014 International Workshop on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/IWCE.2014.6865875
  • Filename
    6865875