Title :
Critical path coverage testing of embedded software based on LCSAJ
Author :
Xiao Zhi ; Jianghua Zhang
Author_Institution :
Xi´an Electron. Eng. Res. Inst., Xi´an, China
Abstract :
With the growing complexity of modern embedded software it is less feasible for testers to execute the complete path coverage testing in the engineering. With regard to this situation, this paper introduces a feasible method applied to the critical path coverage testing. In this method, the critical path selection of the program tested is implemented with the algorithm for generating All Path Matrix (APM) in Activity on Edge (AOE) network. Then testers fulfills the test with the help of the analysis of Linear Coded Sequence and Jump (LCSAJ). Experiment results show that this method can reduce greatly the costs of software testing and improve significantly the testing efficiency under the precondition of assuring the software reliability.
Keywords :
embedded systems; matrix algebra; network theory (graphs); program testing; software reliability; AOE network; APM; LCSAJ; activity on edge network; all path matrix; critical path coverage testing; embedded software; linear coded sequence and jump; software reliability; Algorithm design and analysis; Conferences; Embedded software; Industry applications; Mathematical model; Software reliability; Testing; AOE network; APM; LCSAJ; adjacency matrix; critical path;
Conference_Titel :
Advanced Research and Technology in Industry Applications (WARTIA), 2014 IEEE Workshop on
Conference_Location :
Ottawa, ON
DOI :
10.1109/WARTIA.2014.6976486