Title :
A rad-hard multichannel front-end readout ASIC for space applications
Author :
Sordo-Ibañez, S. ; Piñero-Garcia, B. ; Muñoz-Diaz, M. ; Ragel-Morales, Antonio ; Ceballos-Caceres, Joaquin ; Carranza-Gonzalez, Luis ; Espejo-Meana, Servando ; Arias-Drake, Alberto ; Ramos-Martos, Juan ; Mora-Gutierrez, Jose Miguel ; Lagos-Florido, Miguel
Author_Institution :
Dept. de Electron. y Electromagnetismo, Univ. de Sevilla, Sevilla, Spain
Abstract :
This paper presents a rad-hard ASIC that implements a set of instrumentation channels that are highly configurable in terms of resolution, conversion rate, and input voltage range, providing a flexible solution for space applications requiring the digital acquisition of slow input signals with medium-to-high resolutions up to 16 bits. The differential input voltage range can be extended up to 4 Vpp. The instrumentation channels combine a programmable-gain, high input impedance instrumentation amplifier and dual-slope analog-to-digital converters with radiation hardening by design (RHBD) techniques in a standard 0.35 μm CMOS technology. Experimental results demonstrate the performance of the ASIC against radiation effects up to 318 krad of TID, absence of latch-up up to at least 81.8 MeV·cm2/mg, SEUs LETth of 22.5 MeV·cm2/mg and proper operation over an extended operating temperature range.
Keywords :
CMOS integrated circuits; analogue-digital conversion; application specific integrated circuits; instrumentation amplifiers; radiation hardening (electronics); readout electronics; signal detection; space vehicle electronics; CMOS technology; RHBD techniques; differential input voltage range; dual-slope analog-to-digital converters; high input impedance instrumentation amplifier; instrumentation channels; programmable-gain amplifier; rad-hard multichannel front-end readout ASIC; radiation hardening by design techniques; size 0.35 mum; slow input signal digital acquisition; space applications; Aerospace electronics; Application specific integrated circuits; Clocks; Instruments; Radiation effects; Radiation hardening (electronics); Standards; RHBD; aerospace electronics; dual-slope ADC; instrumentation; mixed-signal ASICs;
Conference_Titel :
Metrology for Aerospace (MetroAeroSpace), 2014 IEEE
Conference_Location :
Benevento
DOI :
10.1109/MetroAeroSpace.2014.6865916