Accelerated life tests of a new optocoupler for aerospace application

Author

Andria, G. ; Di Nisio, Attilio ; Scarano, Valeria L. ; Spadavecchia, Maurizio ; Bregoli, M. ; Franceschi, Matteo ; Tavernini, Nicola

Author_Institution

Dept. of Electr. & Inf. Eng., Politec. di Bari, Bari, Italy

fYear

2014

fDate

29-30 May 2014

Firstpage

510

Lastpage

514

Abstract

The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented.

Keywords

life testing; optical couplers; optical testing; reliability; space vehicle electronics; accelerated life tests; accelerated reliability tests; aerospace application; device reliability performance evaluation; electronic device; optocoupler; thermal severities; Acceleration; Aging; Life estimation; Materials; Reliability engineering; Stress; accelerated life test; aerospace; optocoupler; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Metrology for Aerospace (MetroAeroSpace), 2014 IEEE

Conference_Location

Benevento

Type

conf

DOI

10.1109/MetroAeroSpace.2014.6865978

Filename

6865978