Title :
Trapped ion implementation of memory-assisted extended quantum key distribution
Author :
Hudek, Kai M. ; Vrijsen, Geert ; Isabella, Louis ; Gaultney, Daniel ; Lutkenhaus, Norbert ; Liang Jiang ; Jungsang Kim
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
We discuss a practical scheme to implement memory-assisted measurement-device-independent quantum key distribution protocol using trapped ion systems with the potential to extend the range of conventional QKD by a factor of 2.
Keywords :
quantum cryptography; trapped ions; conventional QKD; extended quantum key distribution; independent quantum key distribution protocol; memory-assisted measurement-device; trapped ion implementation; trapped ion systems; Ions; Logic gates; Photonics; Protocols; Quantum computing; Quantum entanglement; Repeaters;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
