Title :
Sparsity-based Ankylography: Recovering 3D structures from a single-shot 2D scattered intensity
Author :
Mutzafi, Maor ; Shechtman, Yoav ; Cohen, Oren ; Eldar, Yonina C. ; Segev, Mordechai
Author_Institution :
Phys. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
We present an algorithmic paradigm for deciphering the 3D structure of a molecule from the far-field intensity of scattered x-ray photons before the molecule disintegrates. Our approach enables surpassing current limits on recoverable information capacity.
Keywords :
X-ray crystallography; X-ray scattering; 3D structure; algorithmic paradigm; scattered X-ray photons; single-shot 2D scattered intensity; sparsity-based Ankylography; Free electron lasers; Image reconstruction; Imaging; Periodic structures; Three-dimensional displays; X-ray imaging; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
