DocumentCode :
177032
Title :
A method for assessing norms of Chinese character based on K-means clustering and hough transformation
Author :
Kunyu Wang ; Zhiyi Qu ; Jianfei Sun
Author_Institution :
Sch. of Inf. & Eng., Lanzhou Univ., Lanzhou, China
fYear :
2014
fDate :
29-30 Sept. 2014
Firstpage :
1256
Lastpage :
1259
Abstract :
In this paper, we process the image of Chinese characters, and assess the regular of Chinese characters in the image. Images of Chinese handwritten characters is processed to remove the irrelevant information such as background color, background noise. After processing and Hough transforming the image, we can get the information of strokes and angle through the outline of the image. After Hough transforming, the lengths and angles of the Hough Lines can be obtained and they are the approximate equivalent to the length and angle of strokes of Chinese characters themselves. Further analyzing the length and angles of the Hough Lines, the structure of Hough Lines can be equivalent to the structure of Chinese character strokes. Using the K-means algorithm of Clustering analysis, we grouped the degree of angles into different clusters. Because of Chinese characters strokes have vertical and horizontal features, we just need analyze the clusters near 0°, 90°, 180°, 45°, 135°. Finally,we use the length of the Hough lines as weights to assess norms of the Chinese characters.
Keywords :
Hough transforms; handwritten character recognition; image colour analysis; pattern clustering; Chinese character norm assessment; Chinese characters strokes; Chinese handwritten characters; Hough line length; Hough transformation; K-means clustering analysis; background color; background noise; horizontal features; vertical features; Character recognition; Clustering algorithms; Conferences; Handwriting recognition; Image edge detection; Industry applications; Noise measurement; Hough transformation; K-Means Clustering; assessment of the norm of Chinese characters; image processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Research and Technology in Industry Applications (WARTIA), 2014 IEEE Workshop on
Conference_Location :
Ottawa, ON
Type :
conf
DOI :
10.1109/WARTIA.2014.6976510
Filename :
6976510
Link To Document :
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