Title :
Non-invasive beam detection in a high average power electron accelerator
Author :
Williams, Julia ; Martinez, Jose Luis ; Van Keuren, J. ; Harris, J. ; Milton, S.V. ; Biedron, S. ; Benson, S.V. ; Evtushenko, P. ; Neil, G.R. ; Zhang, Shaoting
Author_Institution :
Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
A non-invasive, real time, method for measuring the longitudinal emittance of electron bunches can be realized by using electro-optic (EO) detection schemes. Implementation of an EO beam diagnostic within the Colorado State University and Jefferson Laboratory beamlines necessitates investigation into how high average power beams affect various EO crystals. Damage mechanisms from proximity to the e-beam from heavy radiation and beam halo damage can affect the viability of such a procedure. This study seeks to characterize these effects and determine a suitable EO diagnostic procedure for electron bunches in the CSU and J-Lab facilities.
Keywords :
electron accelerators; electron beams; particle beam bunching; particle beam diagnostics; Colorado State University; EO beam diagnostic; Jefferson Laboratory beamline; electron bunch longitudinal emittance; electrooptic detection schemes; high average power electron accelerator; noninvasive beam detection; Crystals; Electric fields; Electron beams; Electrooptic effects; Energy resolution; Laser beams; Optical pulses;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
