Title :
Robustness of scalable all-optical logic gates
Author :
Fushimi, Akihiro ; Tanabe, Takasumi
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
We designed scalable all-optical logic gates that operate at the same input and output wavelength based on microrings. We investigated the influence of input power fluctuations and fabrication errors.
Keywords :
fluctuations; micro-optics; optical logic; fabrication errors; input power fluctuations; input wavelength; microrings; output wavelength; scalable all-optical logic gates; Cavity resonators; Error analysis; Fabrication; Fluctuations; Logic gates; Optical switches; Robustness;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
