DocumentCode
1770900
Title
Robustness of scalable all-optical logic gates
Author
Fushimi, Akihiro ; Tanabe, Takasumi
Author_Institution
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
fYear
2014
fDate
8-13 June 2014
Firstpage
1
Lastpage
2
Abstract
We designed scalable all-optical logic gates that operate at the same input and output wavelength based on microrings. We investigated the influence of input power fluctuations and fabrication errors.
Keywords
fluctuations; micro-optics; optical logic; fabrication errors; input power fluctuations; input wavelength; microrings; output wavelength; scalable all-optical logic gates; Cavity resonators; Error analysis; Fabrication; Fluctuations; Logic gates; Optical switches; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6989157
Link To Document