DocumentCode
1770992
Title
Liquid crystal display black light leakage correlation between VA and IPS by curvature
Author
Jeong, H.S. ; Woo, S.W. ; Kim, S.S. ; Choi, B.D.
Author_Institution
Coll. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear
2014
fDate
2-4 July 2014
Firstpage
73
Lastpage
76
Abstract
Curved displays have received much public and various media interest on display at exhibitions. Curved displays that have been released to date are divided into organic light-emitting diode(OLED) and liquid crystal display (LCD) types. In this study, the characteristics of LCD quality by curvature were measured, and we predicted the possibility of curving a LCD. Two 55 inch flat LCD panels [in plane switching (IPS) mode and vertical alignment (VA) mode] were measured with the same curvature jig to confirm how different black light leakage levels occurred by curvature under the same conditions. Black luminance was measured at nine points from the left of the panel to the right end using luminance measuring equipment. Black light leakage was visually confirmed for panels (VA and IPS) under darkroom conditions. In addition, we confirmed that VA-mode black light leakage was 10 times lower than that of IPS mode. Furthermore, we measured a radius of curvature divided by 4, 5, and 6 m and confirmed that the trend in black light leakage changed with the radius of the curvature.
Keywords
LED displays; brightness; curvature measurement; liquid crystal displays; optical variables measurement; organic light emitting diodes; IFS curvature measurement; IPS mode; LCD; OLED; VA curvature measurement; VA mode; [in plane switching mode; black luminance measurement; curved display; liquid crystal display black light leakage correlation; organic light-emitting diode; vertical alignment mode; Educational institutions; Glass; Liquid crystal displays; Optical polarization; Optical reflection; Stress; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2014 21st International Workshop on
Conference_Location
Kyoto
Type
conf
DOI
10.1109/AM-FPD.2014.6867125
Filename
6867125
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