DocumentCode :
1770992
Title :
Liquid crystal display black light leakage correlation between VA and IPS by curvature
Author :
Jeong, H.S. ; Woo, S.W. ; Kim, S.S. ; Choi, B.D.
Author_Institution :
Coll. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear :
2014
fDate :
2-4 July 2014
Firstpage :
73
Lastpage :
76
Abstract :
Curved displays have received much public and various media interest on display at exhibitions. Curved displays that have been released to date are divided into organic light-emitting diode(OLED) and liquid crystal display (LCD) types. In this study, the characteristics of LCD quality by curvature were measured, and we predicted the possibility of curving a LCD. Two 55 inch flat LCD panels [in plane switching (IPS) mode and vertical alignment (VA) mode] were measured with the same curvature jig to confirm how different black light leakage levels occurred by curvature under the same conditions. Black luminance was measured at nine points from the left of the panel to the right end using luminance measuring equipment. Black light leakage was visually confirmed for panels (VA and IPS) under darkroom conditions. In addition, we confirmed that VA-mode black light leakage was 10 times lower than that of IPS mode. Furthermore, we measured a radius of curvature divided by 4, 5, and 6 m and confirmed that the trend in black light leakage changed with the radius of the curvature.
Keywords :
LED displays; brightness; curvature measurement; liquid crystal displays; optical variables measurement; organic light emitting diodes; IFS curvature measurement; IPS mode; LCD; OLED; VA curvature measurement; VA mode; [in plane switching mode; black luminance measurement; curved display; liquid crystal display black light leakage correlation; organic light-emitting diode; vertical alignment mode; Educational institutions; Glass; Liquid crystal displays; Optical polarization; Optical reflection; Stress; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2014 21st International Workshop on
Conference_Location :
Kyoto
Type :
conf
DOI :
10.1109/AM-FPD.2014.6867125
Filename :
6867125
Link To Document :
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