DocumentCode :
1771097
Title :
Evaluation of photoconductivities in diode connections using n-ch, p-ch, and pin-ch poly-Si TFTs for photosensor application
Author :
Fuchiya, Takahiro ; Maeda, Yuji ; Kadonome, Takayuki ; Tanaka, T. ; Matsuda, Tadamitsu ; Kimura, Mizue
Author_Institution :
Dept. of Electron. & Inf., Ryukoku Univ., Otsu, Japan
fYear :
2014
fDate :
2-4 July 2014
Firstpage :
263
Lastpage :
264
Abstract :
We have evaluated photoconductivities in diode connections using n-ch, p-ch, and pin-ch poly-Si TFTs for photosensor application. It is found that the photoconductivities increase as the illuminance increases for all the TFTs, but they do not change so much as the applied voltage changes. Moreover, the photoconductivities are: p-ch TFT <; pin-ch TFT with the gate terminal to the p-type region <; n-ch TFT <; pin-ch TFT with the gate terminal to the n-type region. Therefore, the pin-ch TFT with the gate terminal to the n-type region is the most suitable for photosensor application.
Keywords :
elemental semiconductors; photoconductivity; photodetectors; photodiodes; silicon; thin film transistors; Si; diode connections; gate terminal; illuminance; n-ch TFTs; n-type region; p-ch TFTs; p-type region; photoconductivity evaluation; photosensor; pin-ch polysilicon TFTs; Educational institutions; Films; Junctions; Logic gates; Photoconductivity; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2014 21st International Workshop on
Conference_Location :
Kyoto
Type :
conf
DOI :
10.1109/AM-FPD.2014.6867189
Filename :
6867189
Link To Document :
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