Title :
Ultra-sensitive mid-infrared photoexpansion nanospectroscopy with background suppression
Author :
Feng Lu ; Mingzhou Jin ; Belkin, Mikhail A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
Abstract :
The ultimate sensitivity of mid-infrared photoexpansion nanospectroscopy is limited by the background signal from photoexpansion of the sample substrate and the probe tip. Here we demonstrate suppression of this signal using a second mid-infrared laser.
Keywords :
infrared spectroscopy; background signal; background suppression; midinfrared laser; probe tip; sample substrate; ultrasensitive midinfrared photoexpansion nanospectroscopy; Absorption; Force; Laser mode locking; Measurement by laser beam; Quantum cascade lasers; Sensitivity; Substrates;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
