• DocumentCode
    1771571
  • Title

    Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

  • Author

    Grajower, Meir ; Stern, Liron ; Desiatov, Boris ; Goykhman, Ilya ; Levy, Uriel

  • Author_Institution
    Dept. of Appl. Phys., Hebrew Univ. of JerusalemJerusalem, Jerusalem, Israel
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.
  • Keywords
    elemental semiconductors; nanophotonics; near-field scanning optical microscopy; silicon; Si; electromagnetic near field; nanoscale resolution; near field scanning thermal microscopy; optical near field; silicon nanophotonics devices; Absorption; Microscopy; Nanoscale devices; Optical imaging; Optical waveguides; Silicon; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2014 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6989500
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1771571