Title :
Silicon wire refractive index characterization using microring resonator effective length from interferograms
Author :
Shih-Hsiang Hsu ; Yung-Chia Yang ; Yu-Hou Su
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
Abstract :
The optical low-coherence interferometry built with an optical ruler was proposed to demonstrate silicon-wire transverse-magnetic polarized indices of refraction and birefringence as 2.02 and 0.64, respectively, from the microring resonator effective length using various interferograms.
Keywords :
birefringence; light interferometry; light refraction; magneto-optical effects; micro-optics; optical resonators; optical waveguides; refractive index measurement; silicon; birefringence; interferograms; light refraction; microring resonator effective length; optical low-coherence interferometry; optical ruler; silicon wire refractive index characterization; silicon-wire transverse-magnetic polarized indices; Optical fiber sensors; Optical interferometry; Optical polarization; Optical refraction; Optical ring resonators; Optical waveguides;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
