• DocumentCode
    1771611
  • Title

    Surface antireflection studies of GaN nanostructures with various effective refractive index profiles

  • Author

    Lu Han ; Hongping Zhao

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    GaN nanostructures with various effective refractive index profiles were numerically studied as broadband omnidirectional antireflection structures for concentrator photovoltaics, as compared to that of the conventional GaN with flat surface.
  • Keywords
    III-V semiconductors; antireflection coatings; gallium compounds; nanostructured materials; refractive index; wide band gap semiconductors; GaN; broadband omnidirectional antireflection structures; concentrator photovoltaics; effective refractive index profiles; nanostructures; surface antireflection; Gallium nitride; Nanostructures; Optical surface waves; Reflection; Refractive index; Surface treatment; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2014 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6989520