Title :
Time-of-flight depth imaging at 1550 nm wavelength at kilometer-range distances using an inGaAs/InP single-photon avalanche diode detector
Author :
Ximing Ren ; McCarthy, Aongus ; Della Frera, Adriano ; Gemmell, Nathan R. ; Krichel, Nils J. ; Scarcella, Carmelo ; Ruggeri, Alfredo ; Tosi, Alberto ; Buller, Gerald S.
Author_Institution :
Inst. of Photonics & Quantum Sci., Heriot-Watt Univ., Edinburgh, UK
Abstract :
We report a photon-counting depth imager with sub-centimeter resolution of low-signature targets at kilometer range. The system exploited a Peltier-cooled InGaAs/InP single-photon detector module and a 1550 nm wavelength pulsed laser with sub-milliwatt average powers.
Keywords :
III-V semiconductors; avalanche photodiodes; gallium arsenide; image resolution; indium compounds; object detection; optical images; photodetectors; photon counting; semiconductor counters; InGaAs-InP; indium gallium arsenide-indium phosphide single-photon avalanche diode detector; kilometer-range distances; photon-counting depth imager; pulsed laser; subcentimeter low-signature target resolution; time-of-flight depth imaging; wavelength 1550 nm; Detectors; Educational institutions; Image resolution; Imaging; Indium gallium arsenide; Indium phosphide; Photonics;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
