DocumentCode
1772201
Title
Polarization-resolved imaging using elliptical silicon nanowire photodetectors
Author
Hyunsung Park ; Crozier, Kenneth B.
Author_Institution
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
fYear
2014
fDate
8-13 June 2014
Firstpage
1
Lastpage
2
Abstract
We fabricate photodetectors comprising silicon nanowires with elliptical cross sections, and show that their spectral responsivities depend on the incident light´s polarization state. We perform polarization-resolved imaging using these photodetectors.
Keywords
image sensors; light polarisation; nanophotonics; nanowires; optical fabrication; photodetectors; silicon; elliptical cross sections; elliptical silicon nanowire photodetectors; incident light polarization state; photodetector fabrication; polarization-resolved imaging; spectral responsivities; Fabrication; Imaging; Optical filters; Photoconductivity; Photodetectors; Polarization; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6989821
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