DocumentCode :
1772260
Title :
Ultrafast imaging of shocked material dynamics with X-ray fee electron laser pulses
Author :
Sandberg, R.L. ; Bolme, C. ; Ramos, K. ; McCulloch, Q. ; Martinez, Ricardo ; Hamilton, V. ; Pierce, T. ; Greenfield, M. ; McGrane, S. ; Barber, J.L. ; Abbey, B. ; Schropp, A. ; Seiboth, F. ; Heiman, P. ; Nagler, B. ; Galtier, E. ; Granados, E.
Author_Institution :
Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1
Lastpage :
2
Abstract :
We present the first single-shot images of a laser-driven shock wave interacting with micron-scale materials inhomogeneities taken with an X-ray free electron laser. Materials dynamics under high strain-rate loading is important to a range of problems.
Keywords :
X-ray lasers; high-speed optical techniques; shock waves; X-ray fee electron laser pulse; laser-driven shock wave interaction; material dynamics; micronscale material inhomogeneity; shocked material dynamics; single-shot images; strain-rate loading; ultrafast imaging; Detectors; Electric shock; Free electron lasers; Laser beams; Materials; X-ray imaging; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6989852
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1772260
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