DocumentCode :
1772417
Title :
Helium-ion-induced radiation damage in LiNbO3 thin film electro-optic modulators
Author :
Hsu-Cheng Huang ; Dadap, Jerry I. ; Osgood, Richard M. ; Malladi, Girish ; Bakhru, Hassaram
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1
Lastpage :
2
Abstract :
We study He+-induced radiation damage in 10-μm-thick LiNbO3-thin-film modulators. Results show induced-strain, scattering from interstitials, and the degree of overlap between guided modes with damaged region result in degradation of device extinction ratio and VπL.
Keywords :
electro-optical modulation; interstitials; ion beam effects; lithium compounds; thin films; LiNbO3; damaged region; device extinction ratio; guided modes; helium-ion-induced radiation damage; induced strain; interstitials; scattering; size 10 mum; thin film electro-optic modulators; Lithium niobate; Optical films; Optical imaging; Optical modulation; Optical polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6989947
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1772417
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