DocumentCode
177265
Title
Differential Fault Analysis on the Families of SIMON and SPECK Ciphers
Author
Tupsamudre, Harshal ; Bisht, Shiwani ; Mukhopadhyay, Debdeep
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, Kharagpur, India
fYear
2014
fDate
23-23 Sept. 2014
Firstpage
40
Lastpage
48
Abstract
In 2013, the US National Security Agency proposed two new families of lightweight block ciphers: SIMON and SPECK. Currently, linear and differential cryptanalytic results for SIMON are available in the literature but no fault attacks have been reported so far on these two cipher families. In this paper, we show that these families of ciphers are vulnerable to differential fault attacks. Specifically, we demonstrate two fault attacks on SIMON and one fault attack on SPECK. The first attack on SIMON assumes a bit-flip fault model and recovers the n-bit last round key of SIMON using n/2 bit faults. The second attack on SIMON uses a more practical, random byte fault model and requires n/8 faults on average to retrieve the last round key. The attack presented on SPECK also assumes a bit-flip fault model and recovers the n-bit last round key of SPECK using n/3 bit faults on average.
Keywords
cryptography; fault tolerant computing; SIMON ciphers; SPECK ciphers; US National Security Agency; bit-flip fault model; differential cryptanalytic results; differential fault analysis; fault attack; lightweight block ciphers; linear cryptanalytic results; n-bit last round key; random byte fault model; Ciphers; Equations; Fault diagnosis; Hamming weight; Mathematical model; National security; Differential Fault Analysis; Fault Attack; Lightweight Block Ciphers; SIMON; SPECK;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2014 Workshop on
Conference_Location
Busan
Type
conf
DOI
10.1109/FDTC.2014.14
Filename
6976630
Link To Document