DocumentCode
1772793
Title
Generic built-in self-repair architectures for SoC logic cores
Author
Balaz, Marcel ; Kristofik, Stefan ; Fischerova, Maria
Author_Institution
Inst. of Inf., Bratislava, Slovakia
fYear
2014
fDate
23-25 April 2014
Firstpage
45
Lastpage
50
Abstract
The built-in self-repair (BISR) concept is utilized and proven by industry mainly in regular structures of system-on-chips (SoCs) memory cores. On the other hand, the idea of self repair concept for logic cores introduced and developed in several papers is relatively new, as the irregular structure of these types of cores represents a serious limitation. However, there is a need of a complex BISR architecture that can be widely used on different types of logic cores in order to support further the reliability of SoCs. This paper presents a generic BISR architecture based on reconfigurable logic blocks (RLBs) applicable for any logic core inside a SoC together with in detail defined basic requirements guiding the architecture development and also algorithms handling fault detection and localization procedure.
Keywords
built-in self test; integrated circuit reliability; integrated logic circuits; logic circuits; system-on-chip; BISR concept; RLBs; SoC logic cores; SoCs memory cores; SoCs reliability; complex BISR architecture; fault detection; fault localization procedure; generic BISR architecture; generic built-in self-repair architectures; reconfigurable logic blocks; system-on-chips; Circuit faults; Computer architecture; Control systems; Fault detection; Maintenance engineering; Reliability; System-on-chip; built-in self-repair; logic core; reconfigurable logic; reliability; system-on-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location
Warsaw
Print_ISBN
978-1-4799-4560-3
Type
conf
DOI
10.1109/DDECS.2014.6868761
Filename
6868761
Link To Document