DocumentCode :
1772803
Title :
Fast time-parallel C-based event-driven RTL simulation
Author :
Ahmad, Tariq Bashir ; Ciesielski, Maciej
Author_Institution :
ECE Dept., Univ. of Massachusetts Amherst, Amherst, MA, USA
fYear :
2014
fDate :
23-25 April 2014
Firstpage :
71
Lastpage :
76
Abstract :
Simulation of the RTL model is one of the first and mandatory steps of the design verification flow. Such a simulation needs to be repeated often due to the changing nature of the design in its early development stages and after consecutive bug fixing. Despite its relatively high level of abstraction, RTL simulation is a very time consuming process, often requiring nightly or week-long regression runs. In this work, we propose an original approach to accelerating RTL simulation that leverages parallelism offered by multi-core machines. However, in contrast to traditional, parallel distributed RTL simulation, the proposed method accelerates RTL simulation in temporal domain by dividing the entire simulation run into independent simulation slices, each to be run on a separate core. It is combined with fast simulation model at ESL level that provides the required initial state for each independent simulation slice. The paper describes the basic idea of the method and provides some initial experimental results showing its effectiveness in improving RTL simulation performance in an automated way.
Keywords :
digital simulation; formal verification; multiprocessing systems; parallel processing; abstraction level; design verification flow; fast simulation model; fast time-parallel C-based event-driven RTL simulation; multicore machines; parallel distributed RTL simulation; register transfer level; Computational modeling; Hardware; Integrated circuit modeling; Load modeling; Logic gates; Mathematical model; Multicore processing; C; ESL; RTL; Simulation; SystemC; Testbench; Verfication; Verilog;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
Type :
conf
DOI :
10.1109/DDECS.2014.6868766
Filename :
6868766
Link To Document :
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