DocumentCode :
1772826
Title :
Reliable execution of statechart-generated correct embedded software under soft errors
Author :
Ferreira, Ronaldo R. ; Klotz, Thomas ; Vortler, Thilo ; da Rolt, Jean ; Nazar, Gabriel L. ; Moreira, Alvaro F. ; Carro, Luigi ; Einwich, Karsten
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear :
2014
fDate :
23-25 April 2014
Firstpage :
147
Lastpage :
152
Abstract :
This paper proposes a design methodology for fault-tolerant embedded systems development that starts from software specification and goes down to hardware execution. The proposed design methodology uses formally verified and correct-by-construction software created from high-level UML statechart models for software specification and implementation. On the hardware reliability side, this paper uses the MoMa architecture for reliable embedded computing which we deploy as a soft-core onto an off-the-shelf FPGA. MoMa introduces architectural innovations that support the semantics of the UML statechart execution in a reliable fashion. The proposed design methodology is evaluated with a real automotive case study based on an exhaustive FPGA-implemented fault injection campaign.
Keywords :
Unified Modeling Language; embedded systems; formal specification; formal verification; software fault tolerance; MoMa architecture; Unified Modelling Language; automotive case study; correct-by-construction software; design methodology; exhaustive FPGA-implemented fault injection campaign; fault-tolerant embedded systems development; field programmable gate array; formally verified software; hardware execution; hardware reliability; high-level UML statechart models; reliable embedded computing; reliable software execution; soft errors; software specification; statechart-generated correct embedded software; Circuit faults; Design methodology; Hardware; Software; Software reliability; Unified modeling language; Model-driven engineering; fault-tolerance; reliability; soft-errors; statecharts;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
Type :
conf
DOI :
10.1109/DDECS.2014.6868779
Filename :
6868779
Link To Document :
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