Title :
Test and diagnosis of power switches
Author :
Valka, M. ; Bosio, A. ; Dilillo, L. ; Todri, A. ; Virazel, A. ; Girard, P. ; Debaud, P. ; Guilhot, S.
Author_Institution :
Univ. of Montpellier II, Montpellier, France
Abstract :
Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC´99 benchmark circuits.
Keywords :
SPICE; design for testability; integrated circuit testing; power integrated circuits; power semiconductor switches; IC; ITC 99 benchmark circuit; SPICE simulation; design for test & diagnosis; diagnosis accuracy; manufacturing defect; power gating technique; power switches; static power consumption; test quality; Circuit faults; Discharges (electric); Integrated circuits; Monitoring; Power demand; Switches; Transistors; Design for Test & Diagnosis; Power Management; Power Switch;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
DOI :
10.1109/DDECS.2014.6868792
