Title :
An approach towards selection of the oscillation frequency for oscillation test of analog ICs
Author :
Kovac, Martin ; Arbet, Daniel ; Nagy, Gabriel ; Stopjakova, Viera
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
The paper deals with a new approach to selection of the optimum value of the oscillation frequency towards increasing the efficiency of the oscillation-based test methods in covering hard-detectable short faults in nanoscale technologies. For this purpose, the Describing-Function analysis was used to calculate of the oscillation frequency of a simple oscillator (an analog circuit under test) modeled in MATLAB. Accuracy of the model was evaluated through comparison of computed parameters to parameters achieved for the same circuit in Cadence.
Keywords :
analogue integrated circuits; fault diagnosis; integrated circuit testing; nanoelectronics; oscillators; Cadence; Matlab; analog ICs; analog circuit under test; describing-function analysis; hard-detectable short faults; nanoscale technology; oscillation frequency selection; oscillation-based test methods; Accuracy; Circuit faults; MATLAB; Mathematical model; Nanoscale devices; Oscillators; Testing; Describing-function; analog test; oscillation test;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
DOI :
10.1109/DDECS.2014.6868805
