DocumentCode :
1772885
Title :
On the in-field test of Branch Prediction Units using the correlated predictor mechanism
Author :
Gaudesi, M. ; Saleem, S. ; Sanchez, E. ; Reorda, M. Sonza ; Tanowe, E.
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear :
2014
fDate :
23-25 April 2014
Firstpage :
286
Lastpage :
289
Abstract :
Branch Prediction Units (BPUs) are widely used to reduce the performance penalties caused by branch instructions in pipelined processors. BPUs may be implemented in different forms: the Branch History Table (BHT) is an effective solution when the goal is predicting the result of conditional branches. In this paper we propose a method to generate test programs able to detect faults affecting the memory existing within a BHT implementing the correlated predictors approach. Our method is particularly suited to be used for the in-field test of a processor and allows detecting any stuck-at fault in the BPU memory. The method does not require the detailed knowledge of the BPU implementation, but only relies on the key parameters of its architecture. We gathered experimental results using the SimpleScalar environment.
Keywords :
computer architecture; correlation methods; integrated circuit testing; logic testing; BPU memory; Correlated Predictor Mechanism; SimpleScalar environment; branch prediction units; fault detection; in-field test; stuck-at fault; Circuit faults; Computer architecture; History; Program processors; Radiation detectors; Shift registers; Testing; branch history table; branch prediction unit; functional test; sbst;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
Type :
conf
DOI :
10.1109/DDECS.2014.6868811
Filename :
6868811
Link To Document :
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