Inaccuracies in the dielectric permittivity due to thickness variation

The dielectric properties of materials play a fundamental role in the description of physical phenomena in many branches of modern science and engineering. Dielectric spectroscopy is a powerful tool for the investigations of soft matter because it is sensitive to material changes on the molecular level. One of the vital questions that arises when we deal with any equipment is about the measurement error and measurement accuracy. In this study we make an attempt to understand and warn about possible challenges in the measurement of the complex permittivity using dielectric spectroscopy. It is shown in the paper that the problems related to the sources of inaccuracies due to bad contact, edge capacities and electrode polarization can be tackled more easily than the error due to thickness variation within a sample.