Title :
Power-loss breakdown of a 750-V, 100-kW, 20-kHz bidirectional isolated DC-DC converter using SiC-MOSFET/SBD dual modules
Author :
Akagi, Hirofumi ; Yamagishi, Tatsuya ; Tan, Nadia Mei Lin ; Kinouchi, Shin-ichi ; Miyazaki, Yuji ; Koyama, Masanori
Author_Institution :
Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper describes the design, construction and testing of a 750-V, 100-kW, 20-kHz bidirectional isolated dual-active-bridge dc-dc converter using four 1.2-kV 400-A SiCMOSFET/SBD dual modules. The maximum conversion efficiency from the dc-input to the dc-output terminals is accurately measured to be as high as 98.7% at 42-kW operation. The overall power loss at the rated-power (100 kW) operation, excluding the gate-drive and control circuit losses, is divided into conduction and switching losses produced by the SiC modules, iron and copper losses due to magnetic devices, and an unknown loss. The power-loss breakdown concludes that the summation of the conduction and switching losses is about 60% of the overall power loss, and that the conduction loss is nearly equal to the switching loss at the 20-kHz, 100-kW operation.
Keywords :
DC-DC power convertors; Schottky diodes; bridge circuits; driver circuits; power MOSFET; silicon compounds; wide band gap semiconductors; MOSFET-SBD dual modules; Schottky barrier diodes; SiC; bidirectional isolated DC-DC converter; bidirectional isolated dual-active-bridge dc-dc converter; conduction losses; control circuit losses; copper losses; current 400 A; dc-output terminals; frequency 20 kHz; gate-drive losses; iron losses; magnetic devices; power 100 kW; power-loss breakdown; rated-power operation; switching losses; voltage 1.2 kV; voltage 750 V; Logic gates; MOSFET; Magnetic circuits; Silicon carbide; Switches; Testing; Zero voltage switching; Bidirectional isolated dc-dc converters; SiC-MOSFET; conversion efficiency; dual-active-bridge configuration;
Conference_Titel :
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location :
Hiroshima
DOI :
10.1109/IPEC.2014.6869672