Title :
Deep Metric Learning for Person Re-identification
Author :
Dong Yi ; Zhen Lei ; Shengcai Liao ; Li, S.Z.
Author_Institution :
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Abstract :
Various hand-crafted features and metric learning methods prevail in the field of person re-identification. Compared to these methods, this paper proposes a more general way that can learn a similarity metric from image pixels directly. By using a "siamese" deep neural network, the proposed method can jointly learn the color feature, texture feature and metric in a unified framework. The network has a symmetry structure with two sub-networks which are connected by a cosine layer. Each sub network includes two convolutional layers and a full connected layer. To deal with the big variations of person images, binomial deviance is used to evaluate the cost between similarities and labels, which is proved to be robust to outliers. Experiments on VIPeR illustrate the superior performance of our method and a cross database experiment also shows its good generalization.
Keywords :
feature extraction; image colour analysis; image texture; learning (artificial intelligence); neural nets; object detection; VIPeR; binomial deviance; color feature learning; convolutional layers; cosine layer; cost evaluation; cross-database experiment; deep metric learning; full-connected layer; image pixels; person images; person re-identification; siamese deep-neural network; similarity metric learning; subnetworks; symmetry structure; texture feature learning; unified framework; Cameras; Databases; Image color analysis; Measurement; Neural networks; Testing; Training;
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
DOI :
10.1109/ICPR.2014.16