DocumentCode
177424
Title
Deep Metric Learning for Person Re-identification
Author
Dong Yi ; Zhen Lei ; Shengcai Liao ; Li, S.Z.
Author_Institution
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
34
Lastpage
39
Abstract
Various hand-crafted features and metric learning methods prevail in the field of person re-identification. Compared to these methods, this paper proposes a more general way that can learn a similarity metric from image pixels directly. By using a "siamese" deep neural network, the proposed method can jointly learn the color feature, texture feature and metric in a unified framework. The network has a symmetry structure with two sub-networks which are connected by a cosine layer. Each sub network includes two convolutional layers and a full connected layer. To deal with the big variations of person images, binomial deviance is used to evaluate the cost between similarities and labels, which is proved to be robust to outliers. Experiments on VIPeR illustrate the superior performance of our method and a cross database experiment also shows its good generalization.
Keywords
feature extraction; image colour analysis; image texture; learning (artificial intelligence); neural nets; object detection; VIPeR; binomial deviance; color feature learning; convolutional layers; cosine layer; cost evaluation; cross-database experiment; deep metric learning; full-connected layer; image pixels; person images; person re-identification; siamese deep-neural network; similarity metric learning; subnetworks; symmetry structure; texture feature learning; unified framework; Cameras; Databases; Image color analysis; Measurement; Neural networks; Testing; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.16
Filename
6976727
Link To Document