• DocumentCode
    1774486
  • Title

    Built-in reliability design of a high-frequency SiC MOSFET power module

  • Author

    Jianfeng Li ; Gurpinar, Emre ; Lopez-Arevalo, Saul ; Castellazzi, Alberto ; Mills, Liam

  • Author_Institution
    Machines & Control Group, Univ. of Nottingham, Nottingham, UK
  • fYear
    2014
  • fDate
    18-21 May 2014
  • Firstpage
    3718
  • Lastpage
    3725
  • Abstract
    A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight.
  • Keywords
    assembling; finite element analysis; power MOSFET; semiconductor device models; semiconductor device reliability; semiconductor device testing; silicon compounds; wide band gap semiconductors; SiC; assembling; built-in reliability design; electrothermomechanical strain; electrothermomechanical stress; finite-element simulation; functional testing; geometry; high switching frequency operation; high-frequency MOSFET power module; three-phase 2-level power module; Ceramics; Joints; Metallization; Reliability; Substrates; Switches; SiC MOSFET; multi-chip power modules; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
  • Conference_Location
    Hiroshima
  • Type

    conf

  • DOI
    10.1109/IPEC.2014.6870033
  • Filename
    6870033