DocumentCode :
1774486
Title :
Built-in reliability design of a high-frequency SiC MOSFET power module
Author :
Jianfeng Li ; Gurpinar, Emre ; Lopez-Arevalo, Saul ; Castellazzi, Alberto ; Mills, Liam
Author_Institution :
Machines & Control Group, Univ. of Nottingham, Nottingham, UK
fYear :
2014
fDate :
18-21 May 2014
Firstpage :
3718
Lastpage :
3725
Abstract :
A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight.
Keywords :
assembling; finite element analysis; power MOSFET; semiconductor device models; semiconductor device reliability; semiconductor device testing; silicon compounds; wide band gap semiconductors; SiC; assembling; built-in reliability design; electrothermomechanical strain; electrothermomechanical stress; finite-element simulation; functional testing; geometry; high switching frequency operation; high-frequency MOSFET power module; three-phase 2-level power module; Ceramics; Joints; Metallization; Reliability; Substrates; Switches; SiC MOSFET; multi-chip power modules; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location :
Hiroshima
Type :
conf
DOI :
10.1109/IPEC.2014.6870033
Filename :
6870033
Link To Document :
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