DocumentCode
1774486
Title
Built-in reliability design of a high-frequency SiC MOSFET power module
Author
Jianfeng Li ; Gurpinar, Emre ; Lopez-Arevalo, Saul ; Castellazzi, Alberto ; Mills, Liam
Author_Institution
Machines & Control Group, Univ. of Nottingham, Nottingham, UK
fYear
2014
fDate
18-21 May 2014
Firstpage
3718
Lastpage
3725
Abstract
A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight.
Keywords
assembling; finite element analysis; power MOSFET; semiconductor device models; semiconductor device reliability; semiconductor device testing; silicon compounds; wide band gap semiconductors; SiC; assembling; built-in reliability design; electrothermomechanical strain; electrothermomechanical stress; finite-element simulation; functional testing; geometry; high switching frequency operation; high-frequency MOSFET power module; three-phase 2-level power module; Ceramics; Joints; Metallization; Reliability; Substrates; Switches; SiC MOSFET; multi-chip power modules; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location
Hiroshima
Type
conf
DOI
10.1109/IPEC.2014.6870033
Filename
6870033
Link To Document