DocumentCode :
1774606
Title :
Loss analysis and soft-switching characteristics of flyback-forward high gain DC/DC converter with GaN FET
Author :
Zhang Yajing ; Zheng, Trillion Q. ; Li Yan
Author_Institution :
Sch. of Electr. Eng., Beijing Jiaotong Univ., Beijing, China
fYear :
2014
fDate :
18-21 May 2014
Firstpage :
2899
Lastpage :
2903
Abstract :
Compared with Si MOSFET, the GaN FET devices have advantages in the electrical characteristics, thermal properties and mechanical properties. This paper compares electrical properties of the GaN FET and Si MOSFET. Evaluation of the GaN FET based on flyback-forward high gain DC/DC converter at soft-switching condition are presented in detail. In addition, the power loss analysis of GaN FET based flyback-forward high gain DC/DC converter is discussed in detail. Finally a 200W GaN FET based flyback-forward high gain DC/DC converter is established, experiment results verified that the GaN FET is superior to the silicon MOSFET in switching characteristic and efficiency.
Keywords :
DC-DC power convertors; III-V semiconductors; elemental semiconductors; electrical characteristics; flyback-forward high gain DC-DC converter; gallium nitride FET; loss analysis characteristics; mechanical properties; power 200 W; power loss analysis; soft-switching characteristics; thermal properties; Field effect transistors; Gallium nitride; Silicon; Switches; GaN FET; flyback-forward; high gain; loss analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location :
Hiroshima
Type :
conf
DOI :
10.1109/IPEC.2014.6870093
Filename :
6870093
Link To Document :
بازگشت