DocumentCode :
1774645
Title :
The research on reliability and real-time of the scheme of process layer GOOSE network in smart substation based on artificial cobweb topology structure
Author :
Xiaosheng Liu ; Honglin Zhu ; Dianguo Xu ; Yanxiang Li
Author_Institution :
Inst. of Power Electron. & Electr. Driving, Harbin Inst. of Technol., Harbin, China
fYear :
2014
fDate :
18-21 May 2014
Firstpage :
3002
Lastpage :
3006
Abstract :
According to GOOSE defined in the IEC61850 in the smart substation, it explicitly stipulates the requirements for the transmission in reliability and real-time of the process layer network scheme. The cobweb structure is an artificial communication network topology based on cobweb as it occurs in nature. On the basis of the cobweb in the nature, a novel cobweb topology structure, based on process layer GOOSE network in smart substation is proposed in this paper. With the method of fault tree analysis, this paper demonstrates the reliability of the network scheme in one certain smart substation. Industrial Ethernet transmission analysis on delay and OPNET Modeler are also employed to proof the cobweb topology performs well in reliability and real-time. The results of the theoretical analysis and simulation indicate that the cobweb topology structure exhibits excellent reliability and realtime in smart substation GOOSE communication network.
Keywords :
computer network reliability; fault trees; local area networks; substation automation; telecommunication network topology; IEC 61850 standard; OPNET Modeler; artificial cobweb topology structure; artificial communication network topology; fault tree analysis; generic object oriented substation event; industrial Ethernet transmission analysis; network reliability; process layer GOOSE network; process layer network scheme; smart substation; Analytical models; Hardware; Network topology; Ports (Computers); Substations; Switches; Topology; Cobweb; Goose; OPNET Simulation; Real-time; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location :
Hiroshima
Type :
conf
DOI :
10.1109/IPEC.2014.6870111
Filename :
6870111
Link To Document :
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