DocumentCode :
1774785
Title :
Instantaneous temperature field measurement on a hot surface cooled by impinging jet using thermographic phosphor technique
Author :
Yi, S.J. ; Kim, Hae Dong ; Kim, K.C.
Author_Institution :
Sch. of Mech. Eng., Pusan Nat. Univ., Pusan, South Korea
fYear :
2014
fDate :
24-26 June 2014
Firstpage :
1
Lastpage :
5
Abstract :
Thermographic phosphor thermometry was used to measure the instantaneous temperature field of a hot plate cooled by an oblique impinging air jet. For phosphor thermometry, the manganese-activated magnesium fluorogermanate (Mg4FGeO6:Mn) was used as a thermographic phosphor, and a pulsed UV-LED with a 385 nm wavelength was used for the light source. A CMOS high speed camera acquired the phosphorescence images with a 655 nm band-pass filter. A simple and fast calibration method for phosphor thermometry using decay constant was suggested and the results were compared to the conventional lifetime based method. In-situ pixel by pixel calibration procedure was adopted to avoid non-uniform illumination problem. The instantaneous two-dimensional imaging of temperature field on the hot plate was visualized in the transient process after starting the impinging air jet cooling.
Keywords :
CMOS image sensors; calibration; cameras; cooling; fluorine compounds; infrared imaging; light emitting diodes; magnesium compounds; manganese; phosphorescence; phosphors; temperature measurement; transient analysis; ultraviolet sources; 2D instantaneous imaging; CMOS high speed camera; Mg4FGeO6:Mn; band-pass filter; decay constant analysis; hot surface cooling; impinging air jet cooling; in-situ pixel by pixel calibration procedure; instantaneous temperature field measurement; lifetime based method; light source; manganese activated magnesium fluorogermanate; oblique impinging air jet; phosphorescence image acquisition; pulsed UV-LED; thermographic phosphor technique; thermographic phosphor thermometry; transient process; wavelength 385 nm; wavelength 655 nm; Impinging jet; Instantaneous temperature field; Lifetime analysis; Surface temperature; Thermographic phosphor;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Instrumentation Symposium 2014, IET & ISA 60th International
Conference_Location :
London
Electronic_ISBN :
978-1-84919-858-5
Type :
conf
DOI :
10.1049/cp.2014.0542
Filename :
6870181
Link To Document :
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