Title :
Calibration of YAG:Tm at High temperatures and identification of transition dynamics for thermal measurement of surfaces
Author :
Gollub, S.L. ; Walker, D.G. ; Allison, S.W. ; Eldridge, J.I. ; Jenkins, T.P.
Author_Institution :
Vanderbilt Univ., Nashville, TN, USA
Abstract :
Thermographic phosphors are often used to measure temperatures in harsh thermal environments because of their non-contact nature, chemical and thermal robustness, and independence on radiative properties [1]. Because spectral emission from the visible region is used to indicate temperature, black-body radiation from high-temperature surfaces can obscure the measurement signal. The 365 nm emission line in thulium-doped YAG could be used in high-temperature measurements because its wavelength is significantly shorter than other emission lines in common high-temperature phosphors. Although the intensity of the emission peak is somewhat lower than the other characteristic lines in YAG:Tm, the lifetime is measurable and shows a strong dependence on temperatures above 900 °C. Gated spectral measurements help identify energy levels responsible for the 365 nm emission.
Keywords :
infrared imaging; phosphors; surface topography measurement; temperature measurement; thulium; yttrium compounds; YAG:Tm; black-body radiation; calibration; chemical robustness; common high-temperature phosphor; emission line; gated spectral measurement; measurement signal; noncontact nature robustness; radiative property; spectral emission; surface thermal measurement; temperatures measurement; thermal robustness; thermographic phosphor; transition dynamics; wavelength 365 nm; temperature measurement; thermographic phosphor; thulium;
Conference_Titel :
Instrumentation Symposium 2014, IET & ISA 60th International
Conference_Location :
London
Electronic_ISBN :
978-1-84919-858-5
DOI :
10.1049/cp.2014.0549