Title :
Local Gradient Order Pattern for Face Representation and Recognition
Author :
Zhen Lei ; Dong Yi ; Li, S.Z.
Author_Institution :
Center for Biometrics & Security Res. & Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Abstract :
LBP is an effective descriptor for face recognition. LBP encodes the ordinal relationship between the neighborhood samplings and the central one to obtain robust face representation. However, additional information like the difference among neighboring pixels, which may be helpful for face recognition, is ignored. On the other hand, gradient information which enhances the edge response and suppresses the external noise like illumination variation, is usually useful for face recognition. In this paper, we propose a novel face descriptor, namely local gradient order pattern (LGOP), taking into account the ordinal relationship of gradient responses in local region to obtain robust face representation. After pattern encoding, a 2-D histogram is consequently adopted to calculate the occurrence frequency of different patterns and multi-scale histogram features are extracted to represent the face image. We further adopt whitened principal component analysis (WPCA) to reduce the feature dimensionality and improve the computational efficiency. Extensive experiments on FERET, CAS-PEAL and LFW validates the effectiveness of LGOP for both constrained and unconstrained face recognition problems.
Keywords :
face recognition; gradient methods; image denoising; image representation; principal component analysis; 2D histogram; CAS-PEAL; FERET; LBP; LFW; LGOP; WPCA; computational efficiency improvement; constrained face recognition problems; edge response enhancement; external noise suppression; face descriptor; face representation; feature dimensionality; gradient responses; local gradient order pattern; multiscale histogram features; occurrence frequency; pattern encoding; unconstrained face recognition problems; whitened principal component analysis; Databases; Face; Face recognition; Feature extraction; Histograms; Lighting; Robustness;
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
DOI :
10.1109/ICPR.2014.75